Topological Transition in a 3 nm Thick Al Film Grown by Molecular Beam Epitaxy
Joint Authors
Chow, Lee
Liang, Chi-Te
Kumar, Ankit
Su, Guan-Ming
Chang, Chau-Shing
Yeh, Ching-Chen
Wu, Bi-Yi
Patel, Dinesh K.
Fan, Yen-Ting
Lin, Sheng-Di
Source
Issue
Vol. 2019, Issue 2019 (31 Dec. 2019), pp.1-6, 6 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2019-12-27
Country of Publication
Egypt
No. of Pages
6
Main Subjects
Abstract EN
We have performed detailed transport measurements on a 3 nm thick (as-grown) Al film on GaAs prepared by molecular beam epitaxy (MBE).
Such an epitaxial film grown on a GaAs substrate shows the Berezinskii-Kosterlitz-Thouless (BKT) transition, a topological transition in two dimensions.
Our experimental data shows that the MBE-grown Al nanofilm is an ideal system for probing interesting physical phenomena such as the BKT transition and superconductivity.
The increased superconductor transition temperature (~2.4 K) compared to that of bulk Al (1.2 K), together with the ultrathin film quality, may be advantageous for future superconductor-based quantum devices and quantum information technology.
American Psychological Association (APA)
Kumar, Ankit& Su, Guan-Ming& Chang, Chau-Shing& Yeh, Ching-Chen& Wu, Bi-Yi& Patel, Dinesh K.…[et al.]. 2019. Topological Transition in a 3 nm Thick Al Film Grown by Molecular Beam Epitaxy. Journal of Nanomaterials،Vol. 2019, no. 2019, pp.1-6.
https://search.emarefa.net/detail/BIM-1182757
Modern Language Association (MLA)
Kumar, Ankit…[et al.]. Topological Transition in a 3 nm Thick Al Film Grown by Molecular Beam Epitaxy. Journal of Nanomaterials No. 2019 (2019), pp.1-6.
https://search.emarefa.net/detail/BIM-1182757
American Medical Association (AMA)
Kumar, Ankit& Su, Guan-Ming& Chang, Chau-Shing& Yeh, Ching-Chen& Wu, Bi-Yi& Patel, Dinesh K.…[et al.]. Topological Transition in a 3 nm Thick Al Film Grown by Molecular Beam Epitaxy. Journal of Nanomaterials. 2019. Vol. 2019, no. 2019, pp.1-6.
https://search.emarefa.net/detail/BIM-1182757
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1182757