Effects of the Growth Time and the Thickness of the Buffer Layer on the Quality of the Carbon Nanotubes

Author

Chuen, J.

Source

Journal of Nanomaterials

Issue

Vol. 2017, Issue 2017 (31 Dec. 2017), pp.1-6, 6 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2017-11-07

Country of Publication

Egypt

No. of Pages

6

Main Subjects

Chemistry
Civil Engineering

Abstract EN

Direct growth of carbon nanotubes (CNTs) array onto silicon substrate by the chemical vapor deposition (CVD) is reported.

Experimental results show that the thickness of the buffer layer has a significant effect on the morphology and defects of the array, and when the buffer layer is about 15 nm, the best array on the silicon substrate can be obtained.

Moreover, when the growth time is less than the threshold time (70 minutes), the array height will increase with the increase of the time.

Importantly, when the growth time is higher than this threshold time, the growth of array will stop, but when the growth is continuing, the amorphous carbon and carbon can cluster, which will affect the structure of the array.

These results provide a good material basis for the device, thermal, and conductivity technology.

American Psychological Association (APA)

Chuen, J.. 2017. Effects of the Growth Time and the Thickness of the Buffer Layer on the Quality of the Carbon Nanotubes. Journal of Nanomaterials،Vol. 2017, no. 2017, pp.1-6.
https://search.emarefa.net/detail/BIM-1183283

Modern Language Association (MLA)

Chuen, J.. Effects of the Growth Time and the Thickness of the Buffer Layer on the Quality of the Carbon Nanotubes. Journal of Nanomaterials No. 2017 (2017), pp.1-6.
https://search.emarefa.net/detail/BIM-1183283

American Medical Association (AMA)

Chuen, J.. Effects of the Growth Time and the Thickness of the Buffer Layer on the Quality of the Carbon Nanotubes. Journal of Nanomaterials. 2017. Vol. 2017, no. 2017, pp.1-6.
https://search.emarefa.net/detail/BIM-1183283

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-1183283