Molecular Mechanisms Linking Oxidative Stress and Diabetes Mellitus
Joint Authors
Sathyapalan, Thozhukat
Sahebkar, Amirhossein
Yaribeygi, Habib
Atkin, Stephen L.
Source
Oxidative Medicine and Cellular Longevity
Issue
Vol. 2020, Issue 2020 (31 Dec. 2020), pp.1-13, 13 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2020-03-09
Country of Publication
Egypt
No. of Pages
13
Main Subjects
Abstract EN
Type 2 diabetes mellitus (T2DM) is the most prevalent metabolic disorder characterized by chronic hyperglycemia and an inadequate response to circulatory insulin by peripheral tissues resulting in insulin resistance.
Insulin resistance has a complex pathophysiology, and it is contributed to by multiple factors including oxidative stress.
Oxidative stress refers to an imbalance between free radical production and the antioxidant system leading to a reduction of peripheral insulin sensitivity and contributing to the development of T2DM via several molecular mechanisms.
In this review, we present the molecular mechanisms by which the oxidative milieu contributes to the pathophysiology of insulin resistance and diabetes mellitus.
American Psychological Association (APA)
Yaribeygi, Habib& Sathyapalan, Thozhukat& Atkin, Stephen L.& Sahebkar, Amirhossein. 2020. Molecular Mechanisms Linking Oxidative Stress and Diabetes Mellitus. Oxidative Medicine and Cellular Longevity،Vol. 2020, no. 2020, pp.1-13.
https://search.emarefa.net/detail/BIM-1205649
Modern Language Association (MLA)
Yaribeygi, Habib…[et al.]. Molecular Mechanisms Linking Oxidative Stress and Diabetes Mellitus. Oxidative Medicine and Cellular Longevity No. 2020 (2020), pp.1-13.
https://search.emarefa.net/detail/BIM-1205649
American Medical Association (AMA)
Yaribeygi, Habib& Sathyapalan, Thozhukat& Atkin, Stephen L.& Sahebkar, Amirhossein. Molecular Mechanisms Linking Oxidative Stress and Diabetes Mellitus. Oxidative Medicine and Cellular Longevity. 2020. Vol. 2020, no. 2020, pp.1-13.
https://search.emarefa.net/detail/BIM-1205649
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1205649