No-Reference Quality Assessment Method for Blurriness of SEM Micrographs with Multiple Texture
Joint Authors
Lu, Zhaolin
Hu, Xiaojuan
Li, Shiyin
Xu, Hui
Wang, Hui
Source
Issue
Vol. 2019, Issue 2019 (31 Dec. 2019), pp.1-15, 15 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2019-06-02
Country of Publication
Egypt
No. of Pages
15
Main Subjects
Information Technology and Computer Science
Abstract EN
Scanning electron microscopy (SEM) plays an important role in the intuitive understanding of microstructures because it can provide ultrahigh magnification.
Tens or hundreds of images are regularly generated and saved during a typical microscopy imaging process.
Given the subjectivity of a microscopist’s focusing operation, blurriness is an important distortion that debases the quality of micrographs.
The selection of high-quality micrographs using subjective methods is expensive and time-consuming.
This study proposes a new no-reference quality assessment method for evaluating the blurriness of SEM micrographs.
The human visual system is more sensitive to the distortions of cartoon components than to those of redundant textured components according to the Gestalt perception psychology and the entropy masking property.
Micrographs are initially decomposed into cartoon and textured components.
Then, the spectral and spatial sharpness maps of the cartoon components are extracted.
One metric is calculated by combining the spatial and spectral sharpness maps of the cartoon components.
The other metric is calculated on the basis of the edge of the maximum local variation map of the cartoon components.
Finally, the two metrics are combined as the final metric.
The objective scores generated using this method exhibit high correlation and consistency with the subjective scores.
American Psychological Association (APA)
Wang, Hui& Hu, Xiaojuan& Xu, Hui& Li, Shiyin& Lu, Zhaolin. 2019. No-Reference Quality Assessment Method for Blurriness of SEM Micrographs with Multiple Texture. Scanning،Vol. 2019, no. 2019, pp.1-15.
https://search.emarefa.net/detail/BIM-1207909
Modern Language Association (MLA)
Wang, Hui…[et al.]. No-Reference Quality Assessment Method for Blurriness of SEM Micrographs with Multiple Texture. Scanning No. 2019 (2019), pp.1-15.
https://search.emarefa.net/detail/BIM-1207909
American Medical Association (AMA)
Wang, Hui& Hu, Xiaojuan& Xu, Hui& Li, Shiyin& Lu, Zhaolin. No-Reference Quality Assessment Method for Blurriness of SEM Micrographs with Multiple Texture. Scanning. 2019. Vol. 2019, no. 2019, pp.1-15.
https://search.emarefa.net/detail/BIM-1207909
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1207909