Test Point Selection Method for Analog Circuit Fault Diagnosis Based on Similarity Coefficient

Abstract EN

The demand for testability analysis has increased with the integration densities and complexity of circuits.

As an important part of testability analysis, the test point selection method needs to be researched in depth.

A new similarity coefficient criterion is proposed to determine the fault isolation degree because output responses of a circuit with component tolerance are approximately subject to the normal distribution.

Then, a new test point selection method is proposed based on the fault-pair similarity coefficient criterion information table.

Simulation experiments are used to validate the accuracy of the proposed method in terms of the optimum test point set and fault isolation degree.

The results show that the proposed method improves the performance of test point selection by comparing with the other reported methods.