Theoretical simulation of backscattering electron coefficient for SixGe1-x Si heterostructure as a function of primary electron beam energy and Ge concentration
Joint Authors
Source
Issue
Vol. 13, Issue 2 (31 Aug. 2020), pp.137-147, 11 p.
Publisher
Yarmouk University Deanship of Research and Graduate Studies
Publication Date
2020-08-31
Country of Publication
Jordan
No. of Pages
11
Main Subjects
Abstract EN
This study aims to investigate the backscattering electron coefficient for sixge1-x/si heterostructure sample as a function of primary electron beam energy (0.25-20 kev) and ge concentration in the alloy.
the results obtained have several characteristics that are as follows : the first one is that the intensity of the backscattered signal above the alloy is mainly related to the average atomic number of the sixge1-x alloy.
the second feature is that the backscattering electron coefficient line scan shows a constant value above each layer at low primary electron energies below 5 kev.
however, at 5 kev and above, a peak and a dip appeared on the line scan above si-ge alloy and si, respectively, close to the interfacing line.
furthermore, the shape and height of peak and dip broadening depend on the primary electron energy and incidence position with respect to the interfacing line.
the last feature is that the spatial resolution of the backscattered signal at the interfacing line is improving by decreasing the primary electron energy (below 5 kev) and the shared element (si) concentration.
on the other hand, a poor compositional contrast has been shown at low primary electron energy below 5 kev.
for energies above 5 kev, the spatial resolution becomes weak.
these results can be explained by the behavior of the incident electrons inside the solid (interaction volume), especially at a distance close to the interfacing line and their chance to backscatter out of the sample.
in general, a good compositional contrast with a high spatial resolution can be achieved at primary electron energy equal to 1 keV.
American Psychological Association (APA)
Asad, A. M. D.& Kawariq, H.. 2020. Theoretical simulation of backscattering electron coefficient for SixGe1-x Si heterostructure as a function of primary electron beam energy and Ge concentration. Jordan Journal of Physics،Vol. 13, no. 2, pp.137-147.
https://search.emarefa.net/detail/BIM-1282944
Modern Language Association (MLA)
Asad, A. M. D.& Kawariq, H.. Theoretical simulation of backscattering electron coefficient for SixGe1-x Si heterostructure as a function of primary electron beam energy and Ge concentration. Jordan Journal of Physics Vol. 13, no. 2 (Aug. 2020), pp.137-147.
https://search.emarefa.net/detail/BIM-1282944
American Medical Association (AMA)
Asad, A. M. D.& Kawariq, H.. Theoretical simulation of backscattering electron coefficient for SixGe1-x Si heterostructure as a function of primary electron beam energy and Ge concentration. Jordan Journal of Physics. 2020. Vol. 13, no. 2, pp.137-147.
https://search.emarefa.net/detail/BIM-1282944
Data Type
Journal Articles
Language
English
Record ID
BIM-1282944