Analysis for the effects of coating tungsten nano and micro tips with "Epoxylite 478 Resins" in comparison with those obtained from "Epoxylite Resin UPR-4" coating
Other Title(s)
تحليل آثار طلاء التنغستن بمادة 478 Epoxylite مقارنة مع نتائج بطلاءة بمادة UPR-4 Epoxylite
Dissertant
al-Suud, Ammar Awad Allah Ahmad
Thesis advisor
Musa, Marwan Sulayman Musa
Knápek, Alexandr
University
Mutah University
Faculty
Faculty of Science
Department
Department of physics
University Country
Jordan
Degree
Master
Degree Date
2019
Arabic Abstract
تتداول هذه الرسالة خصائص انبعاث الإلكترون من اسطح المعادن قبل و بعد طلائها بطبقة من المواد العازلة إلى حيز عالي الفراع بسبب وجود مجال كهربائي قوي مطبق عادة ما تسمى هذه العملية انبعاث الإلكترون ( FE ) إنها عملية مهمة لها عدد من التطبيقات التقنية مثل مصدر الإلكترون للمجاهر، و عروض انبعاث المجال و غيرها.
هدفنا الرئيسي في هذه الدراسة هو تطوير بواعث الكترون طويلة العمر تنتج تيارا عالية ومستقرا و عالي السطوع عند استخدام مصدر جهد كهربي منخفض.
تم استخدام نوعين من راتنجات الأبوكسي Lite 478 resin Epoxy و Epoxy ( resin ) لطلاء البواعث و دراسة تأثير هذا الطلاء على كل خصائص منحينيات التيار - الجهد وصور الانيعات الالكتروني وصور الكجهر الالكتروني.
تم تحضير البواعث من أسلاك معدن التينغيستين قطرها ( 0.1 ) ملم عالية النقاء ( 99.995 ) تم تحضيرها على شكل ازواج متماثله الى حد ما في انصاف الاقطار.
تم دراسة هذه العينات تحت ظروف عالية التفريغ، و من ثم تم طلاء كل زوج يسمك معين من مادة الايبوكسي و من ثم تجفيفها بالفرن تحت درجة حرارة 180 Co، و اعادة دراستها تحت ظروف عالة التفريغ.
تضمن هذه الرساله دراسه و تحليل خصائص متحديات التيار – الجهد وصور الانبعاث الالكتروني المسجلة على شاشة محضرة خصيصا لهذا الغرض و صور المجهر الالكتروني الماسح للالكترونات قبل و بعد الطلاء و مقارنة النتائج ببعضه البعض في محاولة لتطوير مصادر الكترونيه جديدة ذات كفاءة عالية.
تمت دراسة مكونات الايبوكسي لتحديد تأثيرها على انبعاث الإلكترونات، لفعل ذلك استخدمنا مجال المجهر الأيوني ( FIM ) و التصوير المقطعي ( APT ).
English Abstract
This thesis deals with the process of electron emission from the sur-face of the material into vacuum due to strong electric field applied.
This process is usually called field electron emission (FE).
It is important pro-cess having number of technical applications at such as electron source for microscopes, field emission displays and other.
Our main goal in this study is to develop a long-life time electron emitter that produce high current, small and stable patterns with high brightness when using a low voltage source.
Two types of epoxy resins are used (―Epoxy Lite 478‖ and ―Epoxy Lite UPR-4‖) and a comparison be-tween them will be reported, in addition to a comparison between our re-sults and previous results.
The characteristics of each type will be recorded at various thicknesses.
These tips are mounted in standard Field Emission Microscope (FEM) and various field electron emission characteristics have been meas-ured under ultra-high vacuum (UHV) condition.
The measurements performed include the I-V characteristics present-ed as Fowler-Nordheim, emission patterns, scanning electron micrographs, transmission electron micrographs.
Under this regime, the effects of ther-mal treatment (baking process) on the emitters were investigated.
Epoxy components were studied to determine its effect on the emis-sion of electrons, to do that we used the field of ion microscope (FIM) and Atom Probe Tomography (APT) e high current, small and stable patterns with high brightness when using a low voltage source.
Two types of epoxy resins are used (―Epoxy Lite 478‖ and ―Epoxy Lite UPR-4‖) and a comparison be-tween them will be reported, in addition to a comparison between our re-sults and previous results.
The characteristics of each type will be recorded at various thicknesses.
These tips are mounted in standard Field Emission Microscope (FEM) and various field electron emission characteristics have been meas-ured under ultra-high vacuum (UHV) condition.
The measurements performed include the I-V characteristics present-ed as Fowler-Nordheim, emission patterns, scanning electron micrographs, transmission electron micrographs.
Under this regime, the effects of ther-mal treatment (baking process) on the emitters were investigated.
Epoxy components were studied to determine its effect on the emis-sion of electrons, to do that we used the field of ion microscope (FIM) and Atom Probe Tomography (APT)
Main Subjects
No. of Pages
96
Table of Contents
Table of contents.
Abstract.
Abstract in Arabic.
Chapter One : Introduction.
Chapter Two : Theoretical background.
Chapter Three : Design and methodology.
Chapter Four : Results and recommendations.
References.
American Psychological Association (APA)
al-Suud, Ammar Awad Allah Ahmad. (2019). Analysis for the effects of coating tungsten nano and micro tips with "Epoxylite 478 Resins" in comparison with those obtained from "Epoxylite Resin UPR-4" coating. (Master's theses Theses and Dissertations Master). Mutah University, Jordan
https://search.emarefa.net/detail/BIM-1382644
Modern Language Association (MLA)
al-Suud, Ammar Awad Allah Ahmad. Analysis for the effects of coating tungsten nano and micro tips with "Epoxylite 478 Resins" in comparison with those obtained from "Epoxylite Resin UPR-4" coating. (Master's theses Theses and Dissertations Master). Mutah University. (2019).
https://search.emarefa.net/detail/BIM-1382644
American Medical Association (AMA)
al-Suud, Ammar Awad Allah Ahmad. (2019). Analysis for the effects of coating tungsten nano and micro tips with "Epoxylite 478 Resins" in comparison with those obtained from "Epoxylite Resin UPR-4" coating. (Master's theses Theses and Dissertations Master). Mutah University, Jordan
https://search.emarefa.net/detail/BIM-1382644
Language
English
Data Type
Arab Theses
Record ID
BIM-1382644
