Optimum design plan of constant stress life testing for exponentiated lomax distribution based on time censoring

Abstract EN

The customers' hopesare having greatsuperiorityreliable goodson periodand reasonable costs.

Then, researchersspendaccelerated life testing thatallowsrapidly them reductionthe examination period and keep a groupof manpower, money and material sources.

The major aim of this paper is to study the constant stress time censoring accelerated life tests.

It is supposed that the lifetime of a test unit monitors an exponentiatedlomax distribution.

The estimators of maximum likelihoodare developedwhen the parameters are unknown.

The shape parameter of the lifetime distribution at constant stress stagesis adopted to be a log linear model.

Furthermore, confidence limits of intervals for the parameters, reliability, hazard functions areformed.

Moreover, optimum constant acceleration life testing plan is studied through the asymptotic generalized variance of the maximum likelihood estimators of the parameters is minimized.

Monte Carlo simulation and two real dataare approved to indicate the theoretical results.