Measurements accuracy and modeling reliability of GaN HEMTs
Author
Source
Journal of Computer and Information Technology
Issue
Vol. 2010, Issue 0 (30 Jun. 2010), pp.14-20, 7 p.
Publisher
Hodeidah University Faculty of Computer Science and Engineering
Publication Date
2010-06-30
Country of Publication
Yemen
No. of Pages
7
Main Subjects
Information Technology and Computer Science
Topics
Abstract EN
In this paper, an important factors for accurate modeling of GaN HEMT is presented.
Measurement uncertainty and frequency range as rules of thumb for reliable extraction of the small-signal model parameter is demonstrated.
Determining the optimal pinch-off bias condition as a key point for reliable extraction of the reactive extrinsic parameters of the model is also investigated.
The results of this study, which is carried out on high-power large size (in the order of 1mm gate width) devices, shows that the mentioned three points should be considered in the modeling procedure
American Psychological Association (APA)
Jarndal, Anwar. 2010. Measurements accuracy and modeling reliability of GaN HEMTs. Journal of Computer and Information Technology،Vol. 2010, no. 0, pp.14-20.
https://search.emarefa.net/detail/BIM-239374
Modern Language Association (MLA)
Jarndal, Anwar. Measurements accuracy and modeling reliability of GaN HEMTs. Journal of Computer and Information Technology No. 0 (2010), pp.14-20.
https://search.emarefa.net/detail/BIM-239374
American Medical Association (AMA)
Jarndal, Anwar. Measurements accuracy and modeling reliability of GaN HEMTs. Journal of Computer and Information Technology. 2010. Vol. 2010, no. 0, pp.14-20.
https://search.emarefa.net/detail/BIM-239374
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references : p. 19-20
Record ID
BIM-239374