Determination of probability of photoelectrons ejection and surface efficiency by using simulation techniques

Abstract EN

The theory of photoelectrons counting statisticaly was simulated using Monte Carlo Methods by means of Mat lab computer programs.The number of photoelectrons is generated randomly and their average is calculated and displayed.

Three different experiments were simulated for numbers of photoelectrons ejected for different data size and the probability of number of photoelectrons ejected was found to be exponentially decaying with these numbers of photoelectrons ejected.

Graphical representation of counting rate against random time was also displayed.

The time of ejection of photoelectrons is found to fluctuate about nominal time.

The enhancement in line width is also found to be normally distributed.The simulation of the efficiency of the surface showed that, it increased with the average intensity of the incident light.

This result is in accord with the fact that the number of photoelectrons is proportional to the intensity of the incident light on the surface.

KEYWORDS: Photon counting,Photoelectrons ejected random process,Monte Carlo methods (Poisson process).