Thickness measurement in conjugated polymer film

Author

Wadeasa, Amal M.

Source

Sudan Journal of Basic Sciences. |n Series : Physical Sciences

Issue

Vol. 2005, Issue 2005 (31 Dec. 2005), pp.135-143, 9 p.

Publisher

Sudan Institute for Natural Sciences Publication Unit

Publication Date

2005-12-31

Country of Publication

Sudan

No. of Pages

9

Main Subjects

Physics

Abstract EN

One of the most important parameters in conjugated polymer devices fabrication is the thickness of the active layer that affects: the quality, optical properties (color), the efficiency of the device and the electrical properties of the devices.

In this work a method Charge Extraction in a Linear Increasing Voltage (CELIV) has been used to measure the thickness of conjugated polymer film in (Nano-scale).

The measurements obtained by CELIV were repeated using other known techniques (X-ray diffraction (XRD), Atomic Force Microscope (AFM), DEKTAK and Ellipseometry) [1].

Simple descriptions for each technique were given.

The variation in the thickness values was discussed.

American Psychological Association (APA)

Wadeasa, Amal M.. 2005. Thickness measurement in conjugated polymer film. Sudan Journal of Basic Sciences. |n Series : Physical Sciences،Vol. 2005, no. 2005, pp.135-143.
https://search.emarefa.net/detail/BIM-310842

Modern Language Association (MLA)

Wadeasa, Amal M.. Thickness measurement in conjugated polymer film. Sudan Journal of Basic Sciences. |n Series : Physical Sciences (2005), pp.135-143.
https://search.emarefa.net/detail/BIM-310842

American Medical Association (AMA)

Wadeasa, Amal M.. Thickness measurement in conjugated polymer film. Sudan Journal of Basic Sciences. |n Series : Physical Sciences. 2005. Vol. 2005, no. 2005, pp.135-143.
https://search.emarefa.net/detail/BIM-310842

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references : p. 142-143

Record ID

BIM-310842