Thickness measurement in conjugated polymer film

Abstract EN

One of the most important parameters in conjugated polymer devices fabrication is the thickness of the active layer that affects: the quality, optical properties (color), the efficiency of the device and the electrical properties of the devices.

In this work a method Charge Extraction in a Linear Increasing Voltage (CELIV) has been used to measure the thickness of conjugated polymer film in (Nano-scale).

The measurements obtained by CELIV were repeated using other known techniques (X-ray diffraction (XRD), Atomic Force Microscope (AFM), DEKTAK and Ellipseometry) [1].

Simple descriptions for each technique were given.

The variation in the thickness values was discussed.