Simulation of an ion optical transport and focusing system

Abstract EN

A simulated ion/electron optical transport and focusing system has been put forward to be mounted on high voltage transmission electron microscope for in situ investigations.

The suggested system consists of three axially symmetric electrostatic lenses namely an einzel lens, an accelerating immersion lens, and a decelerating immersion lens, in addition to an electrostatic quadrupole doublet lens placed on the image side.

The electrodes profile of these lenses is determined from the proposed axial field distributions.

The optical properties of the whole system have been computed together with the trajectory of the accelerated charged-particles beam along the optical axis of the system.

The computed dimensions of the final image have been found to be electron-optically acceptable.