Structure and some optical properties of ZnS thin films prepared by thermal evaporation method

Abstract EN

Zinc sulfide thin films were prepared by thermal evaporation technique, on glass substrate(corning 7059) at different substrate temperatures.

Films structure and grain size were determined by X-ray diffraction (XRD) device.

Films have cubic polycrystalline structure with lattice constant .

The optical constants (refractive index and absorption coefficient) of the films were derived from optical transmission spectra in the wavelength range 300-700 nm.

Data are analyzed by Swanepoel method.

Increasing of substrate temperature, the refractive index of films was increased and all films have nearly same refractive index at wavelength about 630 nm.

Optical band of prepared films are in the range 3.4-3.62 eV and was increased with increasing substrate temperature.

The aim of this study is to obtain matched properties from ZnS thin films to be used in solar cell applications.