Erbium doped hydrogenated amorphous silicon prepared by dc sputtering
Joint Authors
Kechouane, M.
Beldi, N.
Muhib, O.
Muhammad Ibrahim, T.
Barriere, A. S.
Lharidon, H.
Gauneau, M.
Source
Issue
Vol. 2001, Issue 10 (30 Jun. 2001)3 p.
Publisher
Annaba Badji Mokhtar University
Publication Date
2001-06-30
Country of Publication
Algeria
No. of Pages
3
Main Subjects
Topics
Abstract EN
-Highly erbium-doped hydrogenated amorphous silicon (a-Si.
H(Er)) thin films were deposited by dc magnetron sputtering.
Erbium was incorporated into the host material by co-sputtering technique.
Deposited films (0.5 - 1.1 n m thick) were characterized by optical transmission, Rutherford backscattering spectrometry (RBS), secondary ion mass spectrometry and electrical measurements.
RBS and SIMS measurements clearly evidenced an erbium incorporation, with a concentration at about 1 to 2 %, on the whole film thickness.
This erbium incorporation induced an increase in the refractive index value (from 3.2 to 3.55) and a decrease in the optical gap energy value up to 1.14e V.
Moreover, we observed a strong decrease in the electrical resistivity (from 10s to 5500 O.
cm) in a-Si : H(Er) films compared to that undoped a-Si:H films.
American Psychological Association (APA)
Kechouane, M.& Beldi, N.& Muhib, O.& Muhammad Ibrahim, T.& Barriere, A. S.& Lharidon, H.…[et al.]. 2001. Erbium doped hydrogenated amorphous silicon prepared by dc sputtering. Synthèse،Vol. 2001, no. 10.
https://search.emarefa.net/detail/BIM-390078
Modern Language Association (MLA)
Kechouane, M.…[et al.]. Erbium doped hydrogenated amorphous silicon prepared by dc sputtering. Synthèse No. 10 (Jun. 2001).
https://search.emarefa.net/detail/BIM-390078
American Medical Association (AMA)
Kechouane, M.& Beldi, N.& Muhib, O.& Muhammad Ibrahim, T.& Barriere, A. S.& Lharidon, H.…[et al.]. Erbium doped hydrogenated amorphous silicon prepared by dc sputtering. Synthèse. 2001. Vol. 2001, no. 10.
https://search.emarefa.net/detail/BIM-390078
Data Type
Journal Articles
Language
English
Notes
Includes appendix
Record ID
BIM-390078