Study of electronic and geometric properties of metal adsorbed surfaces of silicon by photoelectron spectroscopy and x-ray photoelectron (auger electron)‎ diffraction

Abstract EN

Angle-resolved photoelectron spectroscopy has many applications to the studies of solid surfaces.

Angle-resolved detection of ultraviolet photoelectrons makes it possible to determine the suface state dispersions.

Angle-resolved detection of x-ray photoelectrons or Auger electrons makes it possible to determine surface atomic geometries.

These techniques have been applied to the study of submonolayer metal adsorptions on the Si(lll) and Si(00l) surfaces.

The adsorbed metals are column I, III, IV, and V elements in the periodic table and surface orders studied are V3xV3 on the Si (111) substrate and 2x1 on the Si (001) substrate, respectively.