A microcomputer-based digital IC tester
Joint Authors
al-Hakim, Riyad
al-Khalifah, Bashar S.
Abbush, Abd Allah M.
Source
Mu'tah Journal for Research and Studies : Natural and Applied Sciences Series
Issue
Vol. 10, Issue 3 (31 Oct. 1995), pp.61-80, 20 p.
Publisher
Mutah University Deanship of Academic Research
Publication Date
1995-10-31
Country of Publication
Jordan
No. of Pages
20
Main Subjects
Information Technology and Computer Science
Abstract EN
A simple digital IC tester is designed and implemented at a low change of cost.
An interface circuit is designed to provide a parallel communication between the IC under test (ICUT) and an IBM-PC computer.
A complete friendly-used software package (executable at DOS level) is developed in 8088 machine language.
The black box simulation (BBS) test procedure is introduced to test the combinational circuits.
Other test procedures are presented to test sequential and memory circuits.
American Psychological Association (APA)
al-Hakim, Riyad& al-Khalifah, Bashar S.& Abbush, Abd Allah M.. 1995. A microcomputer-based digital IC tester. Mu'tah Journal for Research and Studies : Natural and Applied Sciences Series،Vol. 10, no. 3, pp.61-80.
https://search.emarefa.net/detail/BIM-396815
Modern Language Association (MLA)
al-Hakim, Riyad…[et al.]. A microcomputer-based digital IC tester. Mu'tah Journal for Research and Studies : Natural and Applied Sciences Series Vol. 10, no. 3 (Oct. 1995), pp.61-80.
https://search.emarefa.net/detail/BIM-396815
American Medical Association (AMA)
al-Hakim, Riyad& al-Khalifah, Bashar S.& Abbush, Abd Allah M.. A microcomputer-based digital IC tester. Mu'tah Journal for Research and Studies : Natural and Applied Sciences Series. 1995. Vol. 10, no. 3, pp.61-80.
https://search.emarefa.net/detail/BIM-396815
Data Type
Journal Articles
Language
English
Notes
Includes appendices : p. 71-80
Record ID
BIM-396815
