Optical properties, structure, and morphology of CuO grown by thermal oxidation of Cu thin film on glass substrate

Abstract EN

Oxidation method was used to prepare nanostructure of cupric oxide (CuO) film.

Thin film of Copper metal were deposited on substrate (quartz) in a thermal vacuum evaporator.

The thickness of the film was measured to about 20 μm.

The thermal oxidation of this evaporated film was done in a horizontally heated quartz furnace at temperature (400°C) in air for 4 hour.

The product was tested by X-ray diffraction pattern (XRD), Fourier transfer infrared (FTIR) spectrometer, The surface properties was characterized using scanning electron microscopy (SEM), UV–vis spectrometer, the average crystal diameter derived from the XRD data analysis is found to be 27nm and completely converts this Cu film to tenorite structure with composition of CuO with peak appeared at 2θ equal to 35.5˚, 38.7˚.

The conversion was also confirmed by the FTIR spectrometer measurement.

The UV–vis spectrum of the material shows significant amount of blue-shift in the band gap energy (Eg) and is found to be 3.82eV due to the quantum confinement effect exerted by the nanocrystals.