Structural and optical properties of ZnO : Co thin films prepared by ultrasonic spray pyrolysis method for DMS applications

Joint Authors

Baghdad, R.
Zellama, K.
Chebbah, K.
Boukteb, S.
Kadari, F.
Bezzerrouk, M. A.
Bu Samahah, M.
Kharrubi, B.
al-Marsi, M.

Source

Journal of New Technology and Materials / Larbi Ben M'hidi Oum el-Bouaghi University.

Publisher

Larbi Ben M'hidi Oum el-Bouaghi University

Publication Date

2014-05-31

Country of Publication

Algeria

No. of Pages

10

Main Subjects

Physics

Topics

• Optical properties

English Abstract

Zinc oxide (ZnO) is an II–VI group semiconductor with a wide band gap of 3.37 eV and large exciton energy of 60 meV at 300 K.

ZnO has been attracted a great deal of scientific attention because of their potential applications in the field of optoelectronics and data storage devices.

In this fact, pure and Co-doped ZnO sized via a simple method: ultrasonic spray pyrolysis under atmospheric pressure.

The structure of the as-prepared samples was characterized by X-ray diffraction (XRD) and Raman spectroscopy.

Compared with the Raman spectra for ZnO pure films, the Co-doping effect on the spectra is revealed by the presence of three additional peaks around 235, 470 and 538 cm-1 due to Co incorporation.

These results show that cobalt ions, in the oxidation state of Co2+, replace Zn2+ ions into the ZnO lattice without changing its wurtzite structure.

The optical properties of the samples were studied by ultra-violet visible near infrared (UV-VIS-NIR) spectroscopy.

These measurements shows absorption wells at approximately 570, 620 and 660 nm appearing in the spectra of the Co-doped samples in comparison with pure ZnO confirming XRD and Raman spectroscopy results.

Data Type

Conference Papers

Record ID

BIM-429803

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