Thickness dependence of the residual resistivity and transport properties of super conducting tin films

Abstract EN

We have studied the variation of residual electrical resistivity of superconducting tin films by Joule evaporation on glass substrates at room temperature ( series I ) and cooled down to 150 K ( series II ) and 77 K (series m ) as a function of their inverse thickness.

The extrapolation to infinite thickness allows to determine the residual resistivity corresponding to the bulk materials of the same series.

The transport properties are interpreted in the framework of the Fuchs-Sondheimer's theory taking into account the value of the product p L given by the free electron model.

We have analysed the measured residual resistivity dependence of To in terms of valence effects and Markowitz-Kadanoff's theory