Reliability Analysis of III-V Solar Cells Grown on Recycled GaAs Substrates and an Electroplated Nickel Substrate
Joint Authors
Tseng, Ming-Chun
Horng, Ray-Hua
Lien, Shui-Yang
Source
International Journal of Photoenergy
Issue
Vol. 2013, Issue 2013 (31 Dec. 2013), pp.1-9, 9 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2013-12-14
Country of Publication
Egypt
No. of Pages
9
Main Subjects
Abstract EN
This study involved analyzing the reliability of two types of III-V solar cells: (1) III-V solar cells grown on new and recycled gallium arsenide (GaAs) substrates and (2) the III-V solar cells transferred onto an electroplated nickel (Ni) substrate as III-V thin-film solar cells by using a cross-shaped pattern epitaxial lift-off (CPELO) process.
The III-V solar cells were grown on new and recycled GaAs substrates to evaluate the reliability of the substrate.
The recycled GaAs substrate was fabricated by using the CPELO process.
The performance of the solar cells grown on the recycled GaAs substrate was affected by the uneven surface morphology of the recycled GaAs substrate, which caused the propagation of these dislocations into the subsequently grown active layer of the solar cell.
The III-V solar cells were transferred onto an electroplated Ni substrate, which was also fabricated by using CPELO technology.
The degradation of the III-V thin-film solar cell after conducting a thermal shock test could have been caused by microcracks or microvoids in the active layer or interface of the heterojunction, which resulted in the reduction of the external quantum efficiency response and the increase of recombination loss.
American Psychological Association (APA)
Horng, Ray-Hua& Tseng, Ming-Chun& Lien, Shui-Yang. 2013. Reliability Analysis of III-V Solar Cells Grown on Recycled GaAs Substrates and an Electroplated Nickel Substrate. International Journal of Photoenergy،Vol. 2013, no. 2013, pp.1-9.
https://search.emarefa.net/detail/BIM-447095
Modern Language Association (MLA)
Horng, Ray-Hua…[et al.]. Reliability Analysis of III-V Solar Cells Grown on Recycled GaAs Substrates and an Electroplated Nickel Substrate. International Journal of Photoenergy No. 2013 (2013), pp.1-9.
https://search.emarefa.net/detail/BIM-447095
American Medical Association (AMA)
Horng, Ray-Hua& Tseng, Ming-Chun& Lien, Shui-Yang. Reliability Analysis of III-V Solar Cells Grown on Recycled GaAs Substrates and an Electroplated Nickel Substrate. International Journal of Photoenergy. 2013. Vol. 2013, no. 2013, pp.1-9.
https://search.emarefa.net/detail/BIM-447095
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-447095