Mie Plasmons : Modes Volumes, Quality Factors, and Coupling Strengths (Purcell Factor)‎ to a Dipolar Emitter

Joint Authors

Dereux, A.
Vincent, R.
Bouhelier, Alexandre
Colas des Francs, G.
Derom, S.

Source

International Journal of Optics

Issue

Vol. 2012, Issue 2012 (31 Dec. 2012), pp.1-8, 8 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2012-02-28

Country of Publication

Egypt

No. of Pages

8

Main Subjects

Physics

Abstract EN

Using either quasistatic approximation or exact Mie expansion, we characterize the localized surface plasmons supported by a metallic spherical nanoparticle.

We estimate the quality factor Qn and define the effective volume Vn of the nth mode in such a way that coupling strength with a neighbouring dipolar emitter is proportional to the ratio Qn/Vn (Purcell factor).

The role of Joule losses, far-field scattering, and mode confinement in the coupling mechanism is introduced and discussed with simple physical understanding, with particular attention paid to energy conservation.

American Psychological Association (APA)

Colas des Francs, G.& Derom, S.& Vincent, R.& Bouhelier, Alexandre& Dereux, A.. 2012. Mie Plasmons : Modes Volumes, Quality Factors, and Coupling Strengths (Purcell Factor) to a Dipolar Emitter. International Journal of Optics،Vol. 2012, no. 2012, pp.1-8.
https://search.emarefa.net/detail/BIM-451918

Modern Language Association (MLA)

Colas des Francs, G.…[et al.]. Mie Plasmons : Modes Volumes, Quality Factors, and Coupling Strengths (Purcell Factor) to a Dipolar Emitter. International Journal of Optics No. 2012 (2012), pp.1-8.
https://search.emarefa.net/detail/BIM-451918

American Medical Association (AMA)

Colas des Francs, G.& Derom, S.& Vincent, R.& Bouhelier, Alexandre& Dereux, A.. Mie Plasmons : Modes Volumes, Quality Factors, and Coupling Strengths (Purcell Factor) to a Dipolar Emitter. International Journal of Optics. 2012. Vol. 2012, no. 2012, pp.1-8.
https://search.emarefa.net/detail/BIM-451918

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-451918