Low Cost Amorphous Silicon Intrinsic Layer for Thin-Film Tandem Solar Cells

Joint Authors

Chang, Sheng-Po
Wu, Ching-In
Chang, Shoou-Jinn
Li, Shuguang
Lam, Kin-Tak

Source

International Journal of Photoenergy

Issue

Vol. 2013, Issue 2013 (31 Dec. 2013), pp.1-5, 5 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2013-11-13

Country of Publication

Egypt

No. of Pages

5

Main Subjects

Chemistry

Abstract EN

The authors propose a methodology to improve both the deposition rate and SiH4 consumption during the deposition of the amorphous silicon intrinsic layer of the a-Si/μc-Si tandem solar cells prepared on Gen 5 glass substrate.

It was found that the most important issue is to find out the saturation point of deposition rate which guarantees saturated utilization of the sourcing gas.

It was also found that amorphous silicon intrinsic layers with the same k value will result in the same degradation of the fabricated modules.

Furthermore, it was found that we could significantly reduce the production cost of the a-Si/μc-Si tandem solar cells prepared on Gen 5 glass substrate by fine-tuning the process parameters.

American Psychological Association (APA)

Wu, Ching-In& Chang, Shoou-Jinn& Lam, Kin-Tak& Li, Shuguang& Chang, Sheng-Po. 2013. Low Cost Amorphous Silicon Intrinsic Layer for Thin-Film Tandem Solar Cells. International Journal of Photoenergy،Vol. 2013, no. 2013, pp.1-5.
https://search.emarefa.net/detail/BIM-452616

Modern Language Association (MLA)

Wu, Ching-In…[et al.]. Low Cost Amorphous Silicon Intrinsic Layer for Thin-Film Tandem Solar Cells. International Journal of Photoenergy No. 2013 (2013), pp.1-5.
https://search.emarefa.net/detail/BIM-452616

American Medical Association (AMA)

Wu, Ching-In& Chang, Shoou-Jinn& Lam, Kin-Tak& Li, Shuguang& Chang, Sheng-Po. Low Cost Amorphous Silicon Intrinsic Layer for Thin-Film Tandem Solar Cells. International Journal of Photoenergy. 2013. Vol. 2013, no. 2013, pp.1-5.
https://search.emarefa.net/detail/BIM-452616

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-452616