Mechanical Researches on Young's Modulus of SCS Nanostructures

Joint Authors

Li, Tie
Wang, Yuelin
Zhou, Ping
Jin, Qinhua

Source

Journal of Nanomaterials

Issue

Vol. 2009, Issue 2009 (31 Dec. 2009), pp.1-6, 6 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2009-05-11

Country of Publication

Egypt

No. of Pages

6

Main Subjects

Engineering Sciences and Information Technology
Chemistry
Civil Engineering

Abstract EN

Nanostructures of SingleCrystalSilicon (SCS) with superior electrical, mechanical, thermal, and optical properties are emerging in the development of novel nanodevices.

Mechanical properties especially Young's modulus are essential in developing and utilizing such nanodevices.

In this paper, experimental researches including bending tests, resonance tests, and tensile tests on Young' s modulus of nanoscaled SCS are reviewed, and their results are compared.

It was found that the values of E measured by different testing methods cannot match to each other.

As the differences cannot be explained as experimental errors, it should be understood by taking surface effect into account.

With a simplified model, we qualitatively explained the difference in E value measured by tensile test and by resonance test for Si nanobeams.

American Psychological Association (APA)

Jin, Qinhua& Li, Tie& Zhou, Ping& Wang, Yuelin. 2009. Mechanical Researches on Young's Modulus of SCS Nanostructures. Journal of Nanomaterials،Vol. 2009, no. 2009, pp.1-6.
https://search.emarefa.net/detail/BIM-463224

Modern Language Association (MLA)

Jin, Qinhua…[et al.]. Mechanical Researches on Young's Modulus of SCS Nanostructures. Journal of Nanomaterials No. 2009 (2009), pp.1-6.
https://search.emarefa.net/detail/BIM-463224

American Medical Association (AMA)

Jin, Qinhua& Li, Tie& Zhou, Ping& Wang, Yuelin. Mechanical Researches on Young's Modulus of SCS Nanostructures. Journal of Nanomaterials. 2009. Vol. 2009, no. 2009, pp.1-6.
https://search.emarefa.net/detail/BIM-463224

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-463224