Mapping Quantitative Trait Loci Using Distorted Markers
Joint Authors
Source
International Journal of Plant Genomics
Issue
Vol. 2009, Issue 2009 (31 Dec. 2009), pp.1-11, 11 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2010-02-21
Country of Publication
Egypt
No. of Pages
11
Main Subjects
Abstract EN
Quantitative trait locus (QTL) mapping is usually performed using markers that follow a Mendelian segregation ratio.
We developed a new method of QTL mapping that can use markers with segregation distortion (non-Mendelian markers).
An EM (expectation-maximization) algorithm is used to estimate QTL and SDL (segregation distortion loci) parameters.
The joint analysis of QTL and SDL is particularly useful for selective genotyping.
Application of the joint analysis is demonstrated using a real life data from a wheat QTL mapping experiment.
American Psychological Association (APA)
Xu, Shizhong& Hu, Zhiqiu. 2010. Mapping Quantitative Trait Loci Using Distorted Markers. International Journal of Plant Genomics،Vol. 2009, no. 2009, pp.1-11.
https://search.emarefa.net/detail/BIM-469992
Modern Language Association (MLA)
Xu, Shizhong& Hu, Zhiqiu. Mapping Quantitative Trait Loci Using Distorted Markers. International Journal of Plant Genomics No. 2009 (2009), pp.1-11.
https://search.emarefa.net/detail/BIM-469992
American Medical Association (AMA)
Xu, Shizhong& Hu, Zhiqiu. Mapping Quantitative Trait Loci Using Distorted Markers. International Journal of Plant Genomics. 2010. Vol. 2009, no. 2009, pp.1-11.
https://search.emarefa.net/detail/BIM-469992
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-469992
