Appraisal on Textured Grain Growth and Photoconductivity of ZnO Thin Film SILAR
Joint Authors
Vattappalam, Sunil C.
Thomas, Deepu
Mathew, Sunny
Augustine, Simon
Source
Issue
Vol. 2014, Issue 2014 (31 Dec. 2014), pp.1-5, 5 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2014-07-13
Country of Publication
Egypt
No. of Pages
5
Main Subjects
Abstract EN
ZnO thin films were prepared by successive ionic layer adsorption reaction (SILAR) method.
The textured grain growth along c-axis in pure ZnO thin films and doped with Sn was studied.
The structural analysis of the thin films was done by X-ray diffraction and surface morphology by scanning electron microscopy.
Textured grain growth of the samples was measured by comparing the peak intensities.
Textured grain growth and photo current in ZnO thin films were found to be enhanced by doping with Sn.
ZnO thin film having good crystallinity with preferential (002) orientation is a semiconductor with photonic properties of potential benefit to biophotonics.
From energy dispersive X-ray analysis, it is inferred that oxygen vacancy creation is responsible for the enhanced textured grain growth in ZnO thin films.
American Psychological Association (APA)
Thomas, Deepu& Vattappalam, Sunil C.& Mathew, Sunny& Augustine, Simon. 2014. Appraisal on Textured Grain Growth and Photoconductivity of ZnO Thin Film SILAR. Advances in Chemistry،Vol. 2014, no. 2014, pp.1-5.
https://search.emarefa.net/detail/BIM-480612
Modern Language Association (MLA)
Thomas, Deepu…[et al.]. Appraisal on Textured Grain Growth and Photoconductivity of ZnO Thin Film SILAR. Advances in Chemistry No. 2014 (2014), pp.1-5.
https://search.emarefa.net/detail/BIM-480612
American Medical Association (AMA)
Thomas, Deepu& Vattappalam, Sunil C.& Mathew, Sunny& Augustine, Simon. Appraisal on Textured Grain Growth and Photoconductivity of ZnO Thin Film SILAR. Advances in Chemistry. 2014. Vol. 2014, no. 2014, pp.1-5.
https://search.emarefa.net/detail/BIM-480612
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-480612