![](/images/graphics-bg.png)
A Unified Approach for Predicting Long- and Short-Term Capability Indices with Dependence on Manufacturing Target Bias
Joint Authors
Pieper, R. J.
Satyala, Nikhil T.
Source
International Journal of Quality, Statistics, and Reliability
Issue
Vol. 2008, Issue 2008 (31 Dec. 2008), pp.1-10, 10 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2009-03-04
Country of Publication
Egypt
No. of Pages
10
Main Subjects
Economics & Business Administration
Economy
Abstract EN
It is shown that the exact solution for the capability index (CPI) for Gaussian-distributed process with target bias can be expressed in terms of an unbiased CPI and a normalized target bias.
The principal advantage of this specific formulation is that it facilitates evaluation of the degradation of the capability of the process due to bias between process mean and the process target.
It is shown how this formalism, initially developed for the short-term process, is readily extended to long-term process for which the distribution is Gaussian.
Readily isolated in the latter case are the two long-term CPI degrading effects, namely, process instability and target bias.
Sufficient conditions to guarantee that long-term processes are distributed as Gaussian are discussed.
Within the context of these assumed conditions, a new paradigm for a long-term locator ‘‘k’’ is proposed.
For a three sigma process the results indicate that the exact CPI model is a less pessimistic predictor than both of the industry CPI models tested.
American Psychological Association (APA)
Satyala, Nikhil T.& Pieper, R. J.. 2009. A Unified Approach for Predicting Long- and Short-Term Capability Indices with Dependence on Manufacturing Target Bias. International Journal of Quality, Statistics, and Reliability،Vol. 2008, no. 2008, pp.1-10.
https://search.emarefa.net/detail/BIM-483653
Modern Language Association (MLA)
Satyala, Nikhil T.& Pieper, R. J.. A Unified Approach for Predicting Long- and Short-Term Capability Indices with Dependence on Manufacturing Target Bias. International Journal of Quality, Statistics, and Reliability No. 2008 (2008), pp.1-10.
https://search.emarefa.net/detail/BIM-483653
American Medical Association (AMA)
Satyala, Nikhil T.& Pieper, R. J.. A Unified Approach for Predicting Long- and Short-Term Capability Indices with Dependence on Manufacturing Target Bias. International Journal of Quality, Statistics, and Reliability. 2009. Vol. 2008, no. 2008, pp.1-10.
https://search.emarefa.net/detail/BIM-483653
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-483653