Equivalent Single-Junction Model of Superconducting Quantum Interference Devices in the Presence of Time-Varying Fields

Author

De Luca, R.

Source

ISRN Condensed Matter Physics

Issue

Vol. 2011, Issue 2011 (31 Dec. 2011), pp.1-5, 5 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2011-11-30

Country of Publication

Egypt

No. of Pages

5

Main Subjects

Physics

Abstract EN

The reduced dynamical model of a two-junction quantum interference device is generalized to the case of time-varying externally applied fluxes with a d.

c.

component and an oscillating addendum whose frequency is comparable with the inverse of the characteristic time for flux dynamics within the superconducting system.

From the resulting effective single-junction model for null inductance of the superconducting loop, it can be seen that the critical current of the device shows a dependence on the frequency and amplitude of the oscillating part of the applied flux.

It can therefore be argued that the latter quantities can be considered as control parameters in the voltage versus applied flux curves of superconducting quantum interference devices.

American Psychological Association (APA)

De Luca, R.. 2011. Equivalent Single-Junction Model of Superconducting Quantum Interference Devices in the Presence of Time-Varying Fields. ISRN Condensed Matter Physics،Vol. 2011, no. 2011, pp.1-5.
https://search.emarefa.net/detail/BIM-493544

Modern Language Association (MLA)

De Luca, R.. Equivalent Single-Junction Model of Superconducting Quantum Interference Devices in the Presence of Time-Varying Fields. ISRN Condensed Matter Physics No. 2011 (2011), pp.1-5.
https://search.emarefa.net/detail/BIM-493544

American Medical Association (AMA)

De Luca, R.. Equivalent Single-Junction Model of Superconducting Quantum Interference Devices in the Presence of Time-Varying Fields. ISRN Condensed Matter Physics. 2011. Vol. 2011, no. 2011, pp.1-5.
https://search.emarefa.net/detail/BIM-493544

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-493544