Adhesion Dynamics in Probing Micro- and Nanoscale Thin Solid Films

Author

He, Xiaoling

Source

Mathematical Problems in Engineering

Issue

Vol. 2008, Issue 2008 (31 Dec. 2008), pp.1-18, 18 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2009-01-27

Country of Publication

Egypt

No. of Pages

18

Main Subjects

Civil Engineering

Abstract EN

This study focuses on modeling the probe dynamics in scratching and indenting thin solid films at micro- and nanoscales.

The model identifies bifurcation conditions that define the stick-slip oscillation patterns of the tip.

It is found that the local energy fluctuations as a function of the inelastic deformation, defect formation, material properties, and contact parameters determine the oscillation behavior.

The transient variation of the localized function makes the response nonlinear at the adhesion junction.

By quantifying the relation between the bifurcation parameters and the oscillation behavior, this model gives a realistic representation of the complex adhesion dynamics.

Specifically, the model establishes the link between the stick-slip behavior and the inelastic deformation and the local potentials.

This model justifies the experimental observations and the molecular dynamics simulation of the adhesion and friction dynamics in both the micro- and nanoscale contact.

American Psychological Association (APA)

He, Xiaoling. 2009. Adhesion Dynamics in Probing Micro- and Nanoscale Thin Solid Films. Mathematical Problems in Engineering،Vol. 2008, no. 2008, pp.1-18.
https://search.emarefa.net/detail/BIM-495155

Modern Language Association (MLA)

He, Xiaoling. Adhesion Dynamics in Probing Micro- and Nanoscale Thin Solid Films. Mathematical Problems in Engineering No. 2008 (2008), pp.1-18.
https://search.emarefa.net/detail/BIM-495155

American Medical Association (AMA)

He, Xiaoling. Adhesion Dynamics in Probing Micro- and Nanoscale Thin Solid Films. Mathematical Problems in Engineering. 2009. Vol. 2008, no. 2008, pp.1-18.
https://search.emarefa.net/detail/BIM-495155

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-495155