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Adhesion Dynamics in Probing Micro- and Nanoscale Thin Solid Films
Author
Source
Mathematical Problems in Engineering
Issue
Vol. 2008, Issue 2008 (31 Dec. 2008), pp.1-18, 18 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2009-01-27
Country of Publication
Egypt
No. of Pages
18
Main Subjects
Abstract EN
This study focuses on modeling the probe dynamics in scratching and indenting thin solid films at micro- and nanoscales.
The model identifies bifurcation conditions that define the stick-slip oscillation patterns of the tip.
It is found that the local energy fluctuations as a function of the inelastic deformation, defect formation, material properties, and contact parameters determine the oscillation behavior.
The transient variation of the localized function makes the response nonlinear at the adhesion junction.
By quantifying the relation between the bifurcation parameters and the oscillation behavior, this model gives a realistic representation of the complex adhesion dynamics.
Specifically, the model establishes the link between the stick-slip behavior and the inelastic deformation and the local potentials.
This model justifies the experimental observations and the molecular dynamics simulation of the adhesion and friction dynamics in both the micro- and nanoscale contact.
American Psychological Association (APA)
He, Xiaoling. 2009. Adhesion Dynamics in Probing Micro- and Nanoscale Thin Solid Films. Mathematical Problems in Engineering،Vol. 2008, no. 2008, pp.1-18.
https://search.emarefa.net/detail/BIM-495155
Modern Language Association (MLA)
He, Xiaoling. Adhesion Dynamics in Probing Micro- and Nanoscale Thin Solid Films. Mathematical Problems in Engineering No. 2008 (2008), pp.1-18.
https://search.emarefa.net/detail/BIM-495155
American Medical Association (AMA)
He, Xiaoling. Adhesion Dynamics in Probing Micro- and Nanoscale Thin Solid Films. Mathematical Problems in Engineering. 2009. Vol. 2008, no. 2008, pp.1-18.
https://search.emarefa.net/detail/BIM-495155
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-495155