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On the Tapping Mode Measurement for Young’s Modulus of Nanocrystalline Metal Coatings
Joint Authors
Jankowski, Alan F.
Brannigan, Eric
Ahmed, H. S. Tanvir
Source
Issue
Vol. 2013, Issue 2013 (31 Dec. 2013), pp.1-10, 10 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2013-09-02
Country of Publication
Egypt
No. of Pages
10
Main Subjects
Engineering Sciences and Information Technology
Chemistry
Abstract EN
Young’s modulus of nanocrystalline metal coatings is measured using the oscillating, that is, tapping, mode of a cantilever with a diamond tip.
The resonant frequency of the cantilever changes when the diamond tip comes in contact with a sample surface.
A Hertz-contact-based model is further developed using higher-order terms in a Taylor series expansion to determine a relationship between the reduced elastic modulus and the shift in the resonant frequency of the cantilever during elastic contact between the diamond tip and sample surface.
The tapping mode technique can be used to accurately determine Young’s modulus that corresponds with the crystalline orientation of the sample surface as demonstrated for nanocrystalline nickel, vanadium, and tantalum coatings.
American Psychological Association (APA)
Ahmed, H. S. Tanvir& Brannigan, Eric& Jankowski, Alan F.. 2013. On the Tapping Mode Measurement for Young’s Modulus of Nanocrystalline Metal Coatings. Journal of Nanotechnology،Vol. 2013, no. 2013, pp.1-10.
https://search.emarefa.net/detail/BIM-496660
Modern Language Association (MLA)
Ahmed, H. S. Tanvir…[et al.]. On the Tapping Mode Measurement for Young’s Modulus of Nanocrystalline Metal Coatings. Journal of Nanotechnology No. 2013 (2013), pp.1-10.
https://search.emarefa.net/detail/BIM-496660
American Medical Association (AMA)
Ahmed, H. S. Tanvir& Brannigan, Eric& Jankowski, Alan F.. On the Tapping Mode Measurement for Young’s Modulus of Nanocrystalline Metal Coatings. Journal of Nanotechnology. 2013. Vol. 2013, no. 2013, pp.1-10.
https://search.emarefa.net/detail/BIM-496660
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-496660