Size-Dependent Indirect Excitation of Trivalent Er Ions via Si Nanocrystals Embedded in a Silicon-Rich Silicon Oxide Matrix Deposited by ECR-PECVD

Joint Authors

Mascher, P.
Wojcik, J.
Podhorodecki, A.
Zatryb, G.
Misiewicz, J.

Source

Journal of Nanotechnology

Issue

Vol. 2009, Issue 2009 (31 Dec. 2009), pp.1-5, 5 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2010-02-08

Country of Publication

Egypt

No. of Pages

5

Main Subjects

Engineering Sciences and Information Technology
Chemistry

Abstract EN

Silicon nanocrystals (Si-nc) embedded in a silicon-rich silicon oxide matrix codoped with Er3+ ions have been fabricated by electron-cyclotron plasma-enhanced chemical vapor deposition.

Indirect excitation of erbium photoluminescence via silicon nanocrystals has been obtained within a broad pump wavelength range.

The influence of different nanocrystal sizes on the excitation transfer from the Si-nc to Er3+ ions is discussed.

American Psychological Association (APA)

Zatryb, G.& Podhorodecki, A.& Misiewicz, J.& Wojcik, J.& Mascher, P.. 2010. Size-Dependent Indirect Excitation of Trivalent Er Ions via Si Nanocrystals Embedded in a Silicon-Rich Silicon Oxide Matrix Deposited by ECR-PECVD. Journal of Nanotechnology،Vol. 2009, no. 2009, pp.1-5.
https://search.emarefa.net/detail/BIM-497308

Modern Language Association (MLA)

Zatryb, G.…[et al.]. Size-Dependent Indirect Excitation of Trivalent Er Ions via Si Nanocrystals Embedded in a Silicon-Rich Silicon Oxide Matrix Deposited by ECR-PECVD. Journal of Nanotechnology No. 2009 (2009), pp.1-5.
https://search.emarefa.net/detail/BIM-497308

American Medical Association (AMA)

Zatryb, G.& Podhorodecki, A.& Misiewicz, J.& Wojcik, J.& Mascher, P.. Size-Dependent Indirect Excitation of Trivalent Er Ions via Si Nanocrystals Embedded in a Silicon-Rich Silicon Oxide Matrix Deposited by ECR-PECVD. Journal of Nanotechnology. 2010. Vol. 2009, no. 2009, pp.1-5.
https://search.emarefa.net/detail/BIM-497308

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-497308