Study of Radiative Defects Using Current-Voltage Characteristics in ZnO Rods Catalytically Grown on 4H-p-SiC
Joint Authors
Willander, M.
Nur, O.
Klason, P.
Hussain, I.
Bano, N.
Source
Issue
Vol. 2010, Issue 2010 (31 Dec. 2010), pp.1-5, 5 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2010-07-27
Country of Publication
Egypt
No. of Pages
5
Main Subjects
Engineering Sciences and Information Technology
Chemistry
Civil Engineering
Abstract EN
High-quality ZnO rods were grown by the vapour-liquid-solid (VLS) technique on 4H-p-SiC substrate.
The current transport mechanisms of the diodes at room temperature (RT) have been explained in term of the space-charge-limited current model based on the energy band diagram of ZnO rods/4H-p-SiC heterostructure.
The tunneling mechanism via deep-level states was found to be the main conduction process at low-applied voltage but at trap-filled limit voltage VTFL all traps are filled and the space-charge-limited current conduction dominated the current transport.
From the RT current voltage measurements, the energy of the deep level trap and the trap concentration were obtained as ∼0.24±0.02 eV and 4.4×1018cm−3, respectively.
The deep level states observed correspond to zinc interstitial (Zni ), responsible for the violet emission.
American Psychological Association (APA)
Bano, N.& Hussain, I.& Nur, O.& Willander, M.& Klason, P.. 2010. Study of Radiative Defects Using Current-Voltage Characteristics in ZnO Rods Catalytically Grown on 4H-p-SiC. Journal of Nanomaterials،Vol. 2010, no. 2010, pp.1-5.
https://search.emarefa.net/detail/BIM-500479
Modern Language Association (MLA)
Bano, N.…[et al.]. Study of Radiative Defects Using Current-Voltage Characteristics in ZnO Rods Catalytically Grown on 4H-p-SiC. Journal of Nanomaterials No. 2010 (2010), pp.1-5.
https://search.emarefa.net/detail/BIM-500479
American Medical Association (AMA)
Bano, N.& Hussain, I.& Nur, O.& Willander, M.& Klason, P.. Study of Radiative Defects Using Current-Voltage Characteristics in ZnO Rods Catalytically Grown on 4H-p-SiC. Journal of Nanomaterials. 2010. Vol. 2010, no. 2010, pp.1-5.
https://search.emarefa.net/detail/BIM-500479
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-500479