Comparative Study of Gamma Radiation Effects on Solar Cells, Photodiodes, and Phototransistors

Joint Authors

Timotijević, Ljubinko
Vujisić, Miloš
Stanković, Koviljka
Rajović, Zoran
Nikolić, Dejan

Source

International Journal of Photoenergy

Issue

Vol. 2013, Issue 2013 (31 Dec. 2013), pp.1-6, 6 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2013-05-28

Country of Publication

Egypt

No. of Pages

6

Main Subjects

Chemistry

Abstract EN

This paper presents the behavior of various optoelectronic devices after gamma irradiation.

A number of PIN photodiodes, phototransistors, and solar panels have been exposed to gamma irradiation.

Several types of photodiodes and phototransistors were used in the experiment.

I-V characteristics (current dependance on voltage) of these devices have been measured before and after irradiation.

The process of annealing has also been observed.

A comparative analysis of measurement results has been performed in order to determine the reliability of optoelectronic devices in radiation environments.

American Psychological Association (APA)

Nikolić, Dejan& Stanković, Koviljka& Timotijević, Ljubinko& Rajović, Zoran& Vujisić, Miloš. 2013. Comparative Study of Gamma Radiation Effects on Solar Cells, Photodiodes, and Phototransistors. International Journal of Photoenergy،Vol. 2013, no. 2013, pp.1-6.
https://search.emarefa.net/detail/BIM-502685

Modern Language Association (MLA)

Nikolić, Dejan…[et al.]. Comparative Study of Gamma Radiation Effects on Solar Cells, Photodiodes, and Phototransistors. International Journal of Photoenergy No. 2013 (2013), pp.1-6.
https://search.emarefa.net/detail/BIM-502685

American Medical Association (AMA)

Nikolić, Dejan& Stanković, Koviljka& Timotijević, Ljubinko& Rajović, Zoran& Vujisić, Miloš. Comparative Study of Gamma Radiation Effects on Solar Cells, Photodiodes, and Phototransistors. International Journal of Photoenergy. 2013. Vol. 2013, no. 2013, pp.1-6.
https://search.emarefa.net/detail/BIM-502685

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-502685