Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
Joint Authors
Source
Advances in Materials Science and Engineering
Issue
Vol. 2009, Issue 2009 (31 Dec. 2009), pp.1-6, 6 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2010-01-19
Country of Publication
Egypt
No. of Pages
6
Main Subjects
Engineering Sciences and Information Technology
Abstract EN
SrBi4Ti4O15 (SBTi) thin films were deposited by the polymeric precursor method on Pt bottom electrodes.
The obtained films were characterized by X-ray diffraction, scanning electron microscopy, Raman spectroscopy, and dielectric spectroscopy analyses.
The capacitance-voltage (C-V) characteristics of perovskite thin film showed normal ferroelectric behavior.
The remanent polarization and coercive fields were 5.4 μC/cm2 and 85 kV/cm, respectively.
Dielectric spectroscopy was employed to examine the polycrystalline behavior of ferroelectric material and the mechanisms responsible for the dielectric performance of the thin film.
American Psychological Association (APA)
Simões, A. Z.& Riccardi, C. S.. 2010. Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution. Advances in Materials Science and Engineering،Vol. 2009, no. 2009, pp.1-6.
https://search.emarefa.net/detail/BIM-508902
Modern Language Association (MLA)
Simões, A. Z.& Riccardi, C. S.. Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution. Advances in Materials Science and Engineering No. 2009 (2009), pp.1-6.
https://search.emarefa.net/detail/BIM-508902
American Medical Association (AMA)
Simões, A. Z.& Riccardi, C. S.. Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution. Advances in Materials Science and Engineering. 2010. Vol. 2009, no. 2009, pp.1-6.
https://search.emarefa.net/detail/BIM-508902
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-508902
