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Modelling of Atomic Imaging and Evaporation in the Field Ion Microscope
Joint Authors
Boland, John J.
Fraser, Keith J.
Source
Issue
Vol. 2012, Issue 2012 (31 Dec. 2012), pp.1-8, 8 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2011-12-12
Country of Publication
Egypt
No. of Pages
8
Main Subjects
Abstract EN
Imaging and evaporation of atoms in the field ion microscope (FIM) has been modelled by using finite difference methods to calculate the voltage distribution around a tip and hence the electric field strength experienced by individual atoms.
Atoms are evaporated based on field strength using a number of different mathematical models which yield broadly similar results.
The tip shapes and simulated FIM images produced show strong agreement with experimental results for tips of the same orientation and crystal structure.
Calculations have also been made to estimate the effects on resolution of using a field-sharpened tip for scanning probe microscopy.
American Psychological Association (APA)
Fraser, Keith J.& Boland, John J.. 2011. Modelling of Atomic Imaging and Evaporation in the Field Ion Microscope. Journal of Sensors،Vol. 2012, no. 2012, pp.1-8.
https://search.emarefa.net/detail/BIM-511657
Modern Language Association (MLA)
Fraser, Keith J.& Boland, John J.. Modelling of Atomic Imaging and Evaporation in the Field Ion Microscope. Journal of Sensors No. 2012 (2012), pp.1-8.
https://search.emarefa.net/detail/BIM-511657
American Medical Association (AMA)
Fraser, Keith J.& Boland, John J.. Modelling of Atomic Imaging and Evaporation in the Field Ion Microscope. Journal of Sensors. 2011. Vol. 2012, no. 2012, pp.1-8.
https://search.emarefa.net/detail/BIM-511657
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-511657