Nonlinear-Electronic Transport in Fe2O3 Thin-Films Grown from Grain-Oriented Iron Foils

Abstract EN

Nonlinear-electronic transport in Fe2O3 thin-films grown by thermal oxidation from grain-oriented iron foils was studied by current-voltage characteristics at room temperature as a function of the oxidation temperature.

Microstructure formation and its changes were investigated by atomic force microscopy and X-ray diffraction studies.

X-ray diffraction has demonstrated that average grain size was weakly increased with the growth temperature.

The analysis of current-voltage characteristics shows ohmic regime at low voltages and space-charge-limited regime at higher voltages.

Space-charge effects resulted from the discontinuous grain growth of the foils.

Further, nonlinear-electronic transport of Fe2O3 thin-films can be useful for the designing of adaptive oxide electronic devices.