Effect of annealing temperature and thickness on the structural and optical properties of CdSethin films

Abstract EN

alloy with different thicknesses (300,700)nm have been grown on glass substrates at room temperature under very low pressure (10-5)Torr with rate of deposition (1.7)nm/sec by thermal evaporation technique, after that these thin films have been heat treated under low pressure (10-2)Torr at (473,673)K for one hour.

X-ray patterns showed that both CdSe alloy and thin films are polycrystalline and have the hexagonal structure with preferential orientation in the [100] and [002] direction respectively.

The optical measurements indicated that CdSe thin films have allowed direct optical energy band gap, and it increases from (1.77- 1.84) eV and from (1.6-1.65)eV with the increase in temperature from (R.T-673)K for thicknesses.

(300,700)nm, respectively.

The optical constants (refractive index, extinction coefficient and the real, imaginary parts of dielectric constant) were also studied.