Preparation and characterization of high quality SnO2 films grown by (HPCVD)
Other Title(s)
تحضير اغشيه أوكسيد القصدير عالية النوعية باستخدام الترسيب الكيمياوي ذو الأساس الحار
Joint Authors
Chiad, Baha T.
Ali, Nathera
Ali, Nagam Th.
Source
Engineering and Technology Journal
Issue
Vol. 32, Issue 4B(s) (30 Apr. 2014), pp.801-810, 10 p.
Publisher
Publication Date
2014-04-30
Country of Publication
Iraq
No. of Pages
10
Main Subjects
Abstract EN
In this research SnO2 thin films have been prepared by using hot plate atmospheric pressure chemical vapor deposition (HPCVD) on glass and Si (n-type) substrates at various temperatures.
Optical properties have been measured by UV-VIS spectrophotometer, maximum transmittance about (94%) at 400 0C.
Structure properties have been studied by using X-ray diffraction (XRD) , its shows that all films have a crystalline structure in nature and by increasing growth temperature from(350-500) 0C diffraction peaks becomes sharper and grain size has been change.
Atomic force microscopy (AFM) uses to analyze the morphology of the Tine Oxides surface structure.
Roughness & Root mean square for different temperature have been investigated.
The results show that both increase with substrate temperature increase this measurements deal with X-Ray diffraction results, that there is large change in the structure state of SnO2 thin f film by changing temperature parameter.
American Psychological Association (APA)
Chiad, Baha T.& Ali, Nathera& Ali, Nagam Th.. 2014. Preparation and characterization of high quality SnO2 films grown by (HPCVD). Engineering and Technology Journal،Vol. 32, no. 4B(s), pp.801-810.
https://search.emarefa.net/detail/BIM-629265
Modern Language Association (MLA)
Chiad, Baha T.…[et al.]. Preparation and characterization of high quality SnO2 films grown by (HPCVD). Engineering and Technology Journal Vol. 32, no. 4B(s) (2014), pp.801-810.
https://search.emarefa.net/detail/BIM-629265
American Medical Association (AMA)
Chiad, Baha T.& Ali, Nathera& Ali, Nagam Th.. Preparation and characterization of high quality SnO2 films grown by (HPCVD). Engineering and Technology Journal. 2014. Vol. 32, no. 4B(s), pp.801-810.
https://search.emarefa.net/detail/BIM-629265
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references : p. 810
Record ID
BIM-629265