Height and feature parameters study of thermally evaporated ZnS thin films by AFM

Abstract EN

AFM has been used to get microscopic information of the surface structure and to plot topographies representing the surface relief.

AFM technique can be used to visualize the surface relief, specify the growth of thin films, and determine Height parameters.

In this work we have studied height and feature parameters for Zinc Sulphide thin films such as the root mean square height RMS, Surface Skewness, Surface Kurtosis, Arithmetical mean height, Density of peaks and Arithmetic mean peak curvature.

It can be seen on optical micrographs the fine grains with different sizes which are distributed over a smooth homogeneous background that may correspond to the amorphous, or polycrystalline phase of ZnS films.

Some of the grains are seen to be united/fused- forming agglomerates.

The surface roughness parameters were determined by using the software of ISO 25178 standard provided with the microscope.