تصحيحات مقترحة على علاقات الخواص الفيزيائية λδ،Rmax ،0λ لأغشية رقيقة متعددة الطبقات من مواد عازلة

Abstract EN

There has been much interest in photonic and spectroscopic devices that are useful for controlling transmission and reflection coefficients such as multilayer thin films, photonic crystals, and various Bragg structures in the form of molds or multilayer thin films.

In this paper, the spectral characteristics of multi layer thin films of three couples of dielectric materials TiO2/SiO2, TiO2/MgF2, and ZrO2/MgF2.

were measured, They were made as one-dimensional photonic crystals, of 8, 10, 12, 14, and 16 layers.

Three important quantities λ0, δλ and Rmax were extracted from experimental spectra for each sample.

Analysis of the above mentioned quantities revealed that there is discrepancy between experimental and theoretical values for these devices.

Correction of the regulating formulae for the above mentioned quantities was suggested.