Synthesis and studying of structural, surface topography and optical properties of MgxZn1-xO thin Films by spray pyrolysis method

Abstract EN

In the present paper, MgxZn1-xO thin films were synthesized with a wide composition range x=(0.25, 0.5, 0.75) using a spray polyposis technique at 450 °C.

The X-ray data analysis revealed that the films were polycrystalline with hexagonal and cubic structures.

The preferential orientation of all films was absorbed along (002).

Structural parameter such as average crystallite size, dislocation density and micro-striation were also investigated.

AFM results show that the surface topography and the surface quality of the deposited thin film can be controlled by the Mg2+ content of MgxZn1-xO thin films.

The UV-Visible analysis show that the optical absorption values decrease with the increase of Mg2+ concentration.

It is observed that the band gap increases as the Mg2+ concentration increases.

The reflectance spectra of MgxZn1-xO thin films shifted towards the lower wavelength with the increase of Mg2+ concentration.

The extinction coefficient was slightly decreased and shifted towards higher energies with the increase of Mg2+ contents.

These results demonstrate the high quality of single crystal MgxZn1-xO films and their potential in high-performance deep ultraviolet optoelectronic devices.