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A mixture between rule 90 and rule 150 cellular automata as a test pattern generator
Author
Source
Engineering and Technology Journal
Issue
Vol. 36, Issue 9A (30 Sep. 2018), pp.951-956, 6 p.
Publisher
Publication Date
2018-09-30
Country of Publication
Iraq
No. of Pages
6
Main Subjects
Information Technology and Computer Science
Abstract EN
Built-in Self-test (BIST) is one of integrated circuit (IC) testing techniques that can be used as a pseudo-random generator for the Circuit Under Test (CUT).
This paper introduces the design and simulation of a 4-bit test pattern generator (TPG) using a one dimension Linear Hybrid Cellular Automata (LHCA) with a mixture of rule 90 and 150.
LHCA is an enhancement from Linear Feedback Shift Register (LFSR) which can have more random test vectors and improving the cycle length.
Design and simulation have been performed using Quartus II and Model Sim software.
American Psychological Association (APA)
Alawi, Sahar Z.. 2018. A mixture between rule 90 and rule 150 cellular automata as a test pattern generator. Engineering and Technology Journal،Vol. 36, no. 9A, pp.951-956.
https://search.emarefa.net/detail/BIM-834100
Modern Language Association (MLA)
Alawi, Sahar Z.. A mixture between rule 90 and rule 150 cellular automata as a test pattern generator. Engineering and Technology Journal Vol. 36, no. 9A (2018), pp.951-956.
https://search.emarefa.net/detail/BIM-834100
American Medical Association (AMA)
Alawi, Sahar Z.. A mixture between rule 90 and rule 150 cellular automata as a test pattern generator. Engineering and Technology Journal. 2018. Vol. 36, no. 9A, pp.951-956.
https://search.emarefa.net/detail/BIM-834100
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references : p. 955-956
Record ID
BIM-834100