Structural and optical properties of copper ferrite CuFe2O4 thin films prepared at different substrate temperature

Abstract EN

Copper Ferrite CuFe2O4 thin films have been deposited by chemical spray pyrolysis technique (CSPT) with thickness of (0.76± 0.05) μm onto glass substrates at different temperatures (300-450)℃.

All samples were annealed at 500℃ for (1hr.).

It was confirmed from XRD analysis that all films exhibit polycrystalline structure.

In addition, XRD analysis was utilized to compute grain size (N) and dislocation density (δ).

Surface morphology was characterized using SEM and photomicroscope images.

The energy dispersive spectrometry data clearly states that the deposited CuFe2O4 was formed.

The optical properties for all films were studied by recording the transmittance and absorbance spectrum in the range of (200-1000) nm.

The optical energy gap for allowed direct electronic transition varies from (2.35-2.0) eV with increasing of the substrate temperature .The optical constants, such as extinction coefficient (K), refractive index (n), real and imaginary dielectric constants (∈1, ∈2) were calculated and discussed.