Investigation of lecturer's chalk by X-Ray florescence and fast neutron activation techniques

Abstract EN

Different samples of lecturer's chalk were studied, using X-ray florescence (XRF) and Fast Neutron Activation Analysis (FNAA) techniques to ensure the safety of its use.

The K (X-rays) and the gamma-rays were measured, using Si(Li) and high-purity germanium (HPGe) spectrometers to detect and determine qualitatively and quantitatively the constituents of the studied samples.

For the investigated bulk chalk samples, the XRF was used for determination the average neutron flux of 2 × 107 n/cm2 sec.

The concentrations of the elements (Ca and small traces of Al, Fe, Mg and Si) were measured and their presence was confirmed by γ-ray, lifetime and/or XRF measurements.