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Structural and optical properties for nanostructure (Ag2O-Si and Psi) films for photodetector applications
Other Title(s)
الخواص البصرية و التركيبية لأغشية (Ag2O-Si and Psi) النانوية لتطبيقات الكواشف البصرية
Joint Authors
Hamad, Intisar Abbas
Rauf, Asma Muhammad
Khalil, Rana Ismail
Source
Issue
Vol. 16, Issue 4 (sup) (31 Dec. 2019), pp.1036-1042, 7 p.
Publisher
University of Baghdad College of Science for Women
Publication Date
2019-12-31
Country of Publication
Iraq
No. of Pages
7
Main Subjects
Abstract EN
Ag2O (Silver Oxide) is an important p-type (in chasm to most oxides which were n-type), with a high conductivity semiconductor.
From the optical absorbance data, the energy gap value of the Ag2O thin films was 1.93 eV, where this value substantially depends on the production method, vacuum evaporation of silver, and optical properties of Ag2O thin films are also affected by the precipitation conditions.
The n-type and p-type silicon substrates were used with porous silicon wafers to precipitate ±125 nm, as thick Ag2O thin film by thermal evaporation techniques in vacuum and via rapid thermal oxidation of 400oC and oxidation time 95 s, then characterized by measurement of XRD, optical properties and scanning electron microscopy properties (SEM).
Maximum value of photo response obtained from p-Ag2O/p-PS/Si photodetector results revealed two peak sat 600 nm and 800 nm.
According to the x-ray diffraction four peaks appear, (111), (200), (110) and (311) Ag, respectively, (polycrystalline film) and lattice constant of (4.077 Å).
Also the results showed a sharp increasing in the absorption-wave length plot of Ag2O film at UV and IR regions.
The accumulation of the stars-like are semi-regular of the Ag2O nanocrystals on the surface of p-type PS and the other diffuse inside the pores in a nearly uniform distribution with a different grain size on the surface.
The results of the dislocation density and strain are decreased with the grain size increasing.
American Psychological Association (APA)
Hamad, Intisar Abbas& Khalil, Rana Ismail& Rauf, Asma Muhammad. 2019. Structural and optical properties for nanostructure (Ag2O-Si and Psi) films for photodetector applications. Baghdad Science Journal،Vol. 16, no. 4 (sup), pp.1036-1042.
https://search.emarefa.net/detail/BIM-935398
Modern Language Association (MLA)
Hamad, Intisar Abbas…[et al.]. Structural and optical properties for nanostructure (Ag2O-Si and Psi) films for photodetector applications. Baghdad Science Journal Vol. 16, no. 4 (Supplement) (2019), pp.1036-1042.
https://search.emarefa.net/detail/BIM-935398
American Medical Association (AMA)
Hamad, Intisar Abbas& Khalil, Rana Ismail& Rauf, Asma Muhammad. Structural and optical properties for nanostructure (Ag2O-Si and Psi) films for photodetector applications. Baghdad Science Journal. 2019. Vol. 16, no. 4 (sup), pp.1036-1042.
https://search.emarefa.net/detail/BIM-935398
Data Type
Journal Articles
Language
English
Notes
Text in English ; abstracts in English and Arabic.
Record ID
BIM-935398