Field Emission from Self-Assembled Arrays of Lanthanum Monosulfide Nanoprotrusions
Joint Authors
Pramanik, S.
Fairchild, S.
Bandyopadhyay, S.
Fraser, J. W.
Kanchibotla, B.
Binh, Vu Thien
Grazulis, L.
Cahay, M.
Semet, V.
Lockwood, D. J.
Garre, K.
Source
Issue
Vol. 2008, Issue 2008 (31 Dec. 2008), pp.1-4, 4 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2008-02-14
Country of Publication
Egypt
No. of Pages
4
Main Subjects
Abstract EN
The field emission properties of LaS nanoprotrusions called nanodomes, formed by pulsed laser deposition on porous anodic alumina films, have been analyzed with scanning anode field emission microscopy.
The voltage necessary to produce a given field emission current is ∼3.5 times less for nanodomes than for thin films.
Assuming the same work function for LaS thin films and nanoprotrusions, that is, ∼1 eV, a field enhancement factor of ∼5.8 is extracted for the nanodome emitters from Fowler-Nordheim plots of the field emission data.
This correlates well with the aspect ratio of the tallest nanodomes observed in atomic force micrograph measurements.
American Psychological Association (APA)
Semet, V.& Binh, Vu Thien& Cahay, M.& Garre, K.& Fairchild, S.& Grazulis, L.…[et al.]. 2008. Field Emission from Self-Assembled Arrays of Lanthanum Monosulfide Nanoprotrusions. Journal of Nanomaterials،Vol. 2008, no. 2008, pp.1-4.
https://search.emarefa.net/detail/BIM-988107
Modern Language Association (MLA)
Semet, V.…[et al.]. Field Emission from Self-Assembled Arrays of Lanthanum Monosulfide Nanoprotrusions. Journal of Nanomaterials No. 2008 (2008), pp.1-4.
https://search.emarefa.net/detail/BIM-988107
American Medical Association (AMA)
Semet, V.& Binh, Vu Thien& Cahay, M.& Garre, K.& Fairchild, S.& Grazulis, L.…[et al.]. Field Emission from Self-Assembled Arrays of Lanthanum Monosulfide Nanoprotrusions. Journal of Nanomaterials. 2008. Vol. 2008, no. 2008, pp.1-4.
https://search.emarefa.net/detail/BIM-988107
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-988107
