Temperature variation effects in partially depleted SOI n-channel MOSFETs
By: Buazzah, Ahlam juwayn; Buazzah, Bin Yunus; Benmoussat, N.…[et al.]. Journal of New Technology and Materials. Vol. 5, no. 1 (2015), pp.17-26, 10 p.
Subjects: Semiconductors; Integrated circuits