Novel BCD Process Platform with Integrated Self-Extracted JTE Trench Technology for EL Drivers ICs

المؤلفون المشاركون

Huang, Wei
Hu, Nanzhong
Yu, Zongguang
Li, Haiou

المصدر

Journal of Nanomaterials

العدد

المجلد 2014، العدد 2014 (31 ديسمبر/كانون الأول 2014)، ص ص. 1-5، 5ص.

الناشر

Hindawi Publishing Corporation

تاريخ النشر

2014-01-08

دولة النشر

مصر

عدد الصفحات

5

التخصصات الرئيسية

الكيمياء
هندسة مدنية

الملخص EN

A low cost silicon BCD technology in place of high cost SOI BCD technology for monolithic integrated EL driver ICs application is put forward.

Several key technologies are presented.

An advanced SEJTET termination technology was designed instead of the conventional PIOS isolation to obtain smaller chip area and protect HVICs from the occurrence of di/dt effect under PWM operation.

Novel VDMOS/Resurf LDPMOS devices were developed compatibly to obtain the lowest R on , sp , improve silicon utilization, and simplify key process steps.

نمط استشهاد جمعية علماء النفس الأمريكية (APA)

Huang, Wei& Hu, Nanzhong& Yu, Zongguang& Li, Haiou. 2014. Novel BCD Process Platform with Integrated Self-Extracted JTE Trench Technology for EL Drivers ICs. Journal of Nanomaterials،Vol. 2014, no. 2014, pp.1-5.
https://search.emarefa.net/detail/BIM-1041272

نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)

Huang, Wei…[et al.]. Novel BCD Process Platform with Integrated Self-Extracted JTE Trench Technology for EL Drivers ICs. Journal of Nanomaterials No. 2014 (2014), pp.1-5.
https://search.emarefa.net/detail/BIM-1041272

نمط استشهاد الجمعية الطبية الأمريكية (AMA)

Huang, Wei& Hu, Nanzhong& Yu, Zongguang& Li, Haiou. Novel BCD Process Platform with Integrated Self-Extracted JTE Trench Technology for EL Drivers ICs. Journal of Nanomaterials. 2014. Vol. 2014, no. 2014, pp.1-5.
https://search.emarefa.net/detail/BIM-1041272

نوع البيانات

مقالات

لغة النص

الإنجليزية

الملاحظات

Includes bibliographical references

رقم السجل

BIM-1041272