Structure dependence on the composition of (znS)‎ x (CdTe)‎1_x alloys and thin films

الملخص EN

X-ray diffraction(XRD)of(ZnS)x(CdTe)l-x, alloys and thin films for 0

The (XRD) of the alloys showed a stoichiometric structure whereas the (XRD) of the as deposited films observed polycrystalline wurtzite for ZnS and zincblende for CdTe films with peak positions slightly shifted from ZnStowards CdTe and no peak related to ZnS and CdTe is found.

The annealed films at 473K.

for one hour showed an improvement in their crystallization.

Also the grains size of the films was calculated and it is found that there was a fluctuation in their growth depending on the content x and the annealing process.