![](/images/graphics-bg.png)
Parametric Yield-Driven Resource Binding in High-Level Synthesis with Multi-VthVdd Library and Device Sizing
المؤلفون المشاركون
Takach, Andres
Xie, Yuan
Wang, Yu
Chen, Yibo
المصدر
Journal of Electrical and Computer Engineering
العدد
المجلد 2012، العدد 2012 (31 ديسمبر/كانون الأول 2012)، ص ص. 1-14، 14ص.
الناشر
Hindawi Publishing Corporation
تاريخ النشر
2012-05-14
دولة النشر
مصر
عدد الصفحات
14
التخصصات الرئيسية
العلوم الهندسية و تكنولوجيا المعلومات
تكنولوجيا المعلومات وعلم الحاسوب
الملخص EN
The ever-increasing chip power dissipation in SoCs has imposed great challenges on today’s circuit design.
It has been shown that multiple threshold and supply voltages assignment (multi-Vth/Vdd) is an effective way to reduce power dissipation.
However, most of the prior multi-Vth/Vdd optimizations are performed under deterministic conditions.
With the increasing process variability that has significant impact on both the power dissipation and performance of circuit designs, it is necessary to employ statistical approaches in analysis and optimizations for low power.
This paper studies the impact of process variations on the multi-Vth/Vdd technique at the behavioral synthesis level.
A multi-Vth/Vdd resource library is characterized for delay and power variations at different voltage combinations.
Meanwhile, device sizing is performed on the resources in the library to mitigate the impact of variation, and to enlarge the design space for better quality of the design choice.
A parametric yield-driven resource binding algorithm is then proposed, which uses the characterized power and delay distributions and efficiently maximizes power yield under a timing yield constraint.
During the resource binding process, voltage level converters are inserted between resources when required.
Experimental results show that significant power reduction can be achieved with the proposed variation-aware framework, compared with traditional worstcase based deterministic approaches.
نمط استشهاد جمعية علماء النفس الأمريكية (APA)
Chen, Yibo& Wang, Yu& Xie, Yuan& Takach, Andres. 2012. Parametric Yield-Driven Resource Binding in High-Level Synthesis with Multi-VthVdd Library and Device Sizing. Journal of Electrical and Computer Engineering،Vol. 2012, no. 2012, pp.1-14.
https://search.emarefa.net/detail/BIM-446751
نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)
Chen, Yibo…[et al.]. Parametric Yield-Driven Resource Binding in High-Level Synthesis with Multi-VthVdd Library and Device Sizing. Journal of Electrical and Computer Engineering No. 2012 (2012), pp.1-14.
https://search.emarefa.net/detail/BIM-446751
نمط استشهاد الجمعية الطبية الأمريكية (AMA)
Chen, Yibo& Wang, Yu& Xie, Yuan& Takach, Andres. Parametric Yield-Driven Resource Binding in High-Level Synthesis with Multi-VthVdd Library and Device Sizing. Journal of Electrical and Computer Engineering. 2012. Vol. 2012, no. 2012, pp.1-14.
https://search.emarefa.net/detail/BIM-446751
نوع البيانات
مقالات
لغة النص
الإنجليزية
الملاحظات
Includes bibliographical references
رقم السجل
BIM-446751
قاعدة معامل التأثير والاستشهادات المرجعية العربي "ارسيف Arcif"
أضخم قاعدة بيانات عربية للاستشهادات المرجعية للمجلات العلمية المحكمة الصادرة في العالم العربي
![](/images/ebook-kashef.png)
تقوم هذه الخدمة بالتحقق من التشابه أو الانتحال في الأبحاث والمقالات العلمية والأطروحات الجامعية والكتب والأبحاث باللغة العربية، وتحديد درجة التشابه أو أصالة الأعمال البحثية وحماية ملكيتها الفكرية. تعرف اكثر
![](/images/kashef-image.png)