Parametric Yield-Driven Resource Binding in High-Level Synthesis with Multi-VthVdd Library and Device Sizing
Joint Authors
Takach, Andres
Xie, Yuan
Wang, Yu
Chen, Yibo
Source
Journal of Electrical and Computer Engineering
Issue
Vol. 2012, Issue 2012 (31 Dec. 2012), pp.1-14, 14 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2012-05-14
Country of Publication
Egypt
No. of Pages
14
Main Subjects
Engineering Sciences and Information Technology
Information Technology and Computer Science
Abstract EN
The ever-increasing chip power dissipation in SoCs has imposed great challenges on today’s circuit design.
It has been shown that multiple threshold and supply voltages assignment (multi-Vth/Vdd) is an effective way to reduce power dissipation.
However, most of the prior multi-Vth/Vdd optimizations are performed under deterministic conditions.
With the increasing process variability that has significant impact on both the power dissipation and performance of circuit designs, it is necessary to employ statistical approaches in analysis and optimizations for low power.
This paper studies the impact of process variations on the multi-Vth/Vdd technique at the behavioral synthesis level.
A multi-Vth/Vdd resource library is characterized for delay and power variations at different voltage combinations.
Meanwhile, device sizing is performed on the resources in the library to mitigate the impact of variation, and to enlarge the design space for better quality of the design choice.
A parametric yield-driven resource binding algorithm is then proposed, which uses the characterized power and delay distributions and efficiently maximizes power yield under a timing yield constraint.
During the resource binding process, voltage level converters are inserted between resources when required.
Experimental results show that significant power reduction can be achieved with the proposed variation-aware framework, compared with traditional worstcase based deterministic approaches.
American Psychological Association (APA)
Chen, Yibo& Wang, Yu& Xie, Yuan& Takach, Andres. 2012. Parametric Yield-Driven Resource Binding in High-Level Synthesis with Multi-VthVdd Library and Device Sizing. Journal of Electrical and Computer Engineering،Vol. 2012, no. 2012, pp.1-14.
https://search.emarefa.net/detail/BIM-446751
Modern Language Association (MLA)
Chen, Yibo…[et al.]. Parametric Yield-Driven Resource Binding in High-Level Synthesis with Multi-VthVdd Library and Device Sizing. Journal of Electrical and Computer Engineering No. 2012 (2012), pp.1-14.
https://search.emarefa.net/detail/BIM-446751
American Medical Association (AMA)
Chen, Yibo& Wang, Yu& Xie, Yuan& Takach, Andres. Parametric Yield-Driven Resource Binding in High-Level Synthesis with Multi-VthVdd Library and Device Sizing. Journal of Electrical and Computer Engineering. 2012. Vol. 2012, no. 2012, pp.1-14.
https://search.emarefa.net/detail/BIM-446751
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-446751